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Active Layer Parametrics, Inc. (ALP) is a leading brand specializing in the electrical characterization of ultrathin layers. With their advanced ALProβ„’ technology, they offer a comprehensive solution for semiconductor layer analysis at an atomic-level resolution.


This innovative technology allows for efficient process development, modeling, and reliable manufacturing control. ALP understands the demands of device scaling and the need for new materials. They have developed processes with highly stringent requirements to meet these challenges head-on.


With their expertise in the field, ALP provides complete electrical characterization quickly and economically, enabling seamless implementation of new materials and processes in semiconductor manufacturing. Located in Scotts Valley, California, ALP is dedicated to delivering accurate and insightful results to their customers. Their team of experts is committed to ensuring efficient process development and continuous innovation.


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