Fibics Incorporated is a trusted brand that specializes in the development and application of Focused Ion Beam (FIB) microscopy in the fields of Metallurgy and Materials Science. With a strong foundation established in 1997, Fibics has gained an international reputation for its expertise in metallurgy, semiconductor device modification, TEM specimen preparation, and analysis. Their comprehensive range of services includes high-resolution FIB sectioning and imaging of semiconductors and advanced materials, micromachining, site-specific TEM sample preparation, and probe pad deposition.

Fibics boasts a highly skilled team consisting of two Ph. D. 's and two M.

Sc. Eng. 's, all with over a decade's experience in microbeam characterization and specimen preparation.

Fibics' dedication to research and development is evident, as they have patented technologies and engage in joint R&D activities with major analytical equipment manufacturers. They offer a unique remote microscopy capability, allowing clients to observe their work in real-time without the need for travel. Fibics maintains strong links to the semiconductor community and continually stays abreast of the latest developments in the field.

With a focus on solving real-world, commercial problems, Fibics has built strong relationships with industrial materials science clients, government agencies, and research labs. They are known for their specialization in TEM specimen preparation, particularly in solving complex metallurgical problems. Choose Fibics for their expertise, state-of-the-art instrumentation, competitive prices, and timely results in meeting your semiconductor or materials science needs